BibTeX record journals/tvlsi/HessabiOE95

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@article{DBLP:journals/tvlsi/HessabiOE95,
  author       = {Shaahin Hessabi and
                  Mohamed Y. Osman and
                  Mohamed I. Elmasry},
  title        = {Differential BiCMOS logic circuits: fault characterization and design-for-testability},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {3},
  number       = {3},
  pages        = {437--445},
  year         = {1995},
  url          = {https://doi.org/10.1109/92.407001},
  doi          = {10.1109/92.407001},
  timestamp    = {Wed, 03 May 2023 21:33:13 +0200},
  biburl       = {https://dblp.org/rec/journals/tvlsi/HessabiOE95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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