BibTeX record journals/tvlsi/ShimCS17

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@article{DBLP:journals/tvlsi/ShimCS17,
  author       = {Seongbo Shim and
                  Woohyun Chung and
                  Youngsoo Shin},
  title        = {Lithography Defect Probability and Its Application to Physical Design
                  Optimization},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {25},
  number       = {1},
  pages        = {271--285},
  year         = {2017},
  url          = {https://doi.org/10.1109/TVLSI.2016.2572224},
  doi          = {10.1109/TVLSI.2016.2572224},
  timestamp    = {Wed, 11 Mar 2020 18:16:59 +0100},
  biburl       = {https://dblp.org/rec/journals/tvlsi/ShimCS17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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