BibTeX record journals/tvlsi/TangWEPBSHW06

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@article{DBLP:journals/tvlsi/TangWEPBSHW06,
  author       = {Yuyi Tang and
                  Hans{-}Joachim Wunderlich and
                  Piet Engelke and
                  Ilia Polian and
                  Bernd Becker and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Friedrich Hapke and
                  Michael Wittke},
  title        = {X-masking during logic {BIST} and its impact on defect coverage},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {14},
  number       = {2},
  pages        = {193--202},
  year         = {2006},
  url          = {https://doi.org/10.1109/TVLSI.2005.863742},
  doi          = {10.1109/TVLSI.2005.863742},
  timestamp    = {Tue, 21 Mar 2023 21:13:47 +0100},
  biburl       = {https://dblp.org/rec/journals/tvlsi/TangWEPBSHW06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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