BibTeX record journals/tvlsi/ZhangMWSS16

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@article{DBLP:journals/tvlsi/ZhangMWSS16,
  author    = {Runjie Zhang and
               Brett H. Meyer and
               Ke Wang and
               Mircea R. Stan and
               Kevin Skadron},
  title     = {Tolerating the Consequences of Multiple EM-Induced {C4} Bump Failures},
  journal   = {{IEEE} Trans. {VLSI} Syst.},
  volume    = {24},
  number    = {6},
  pages     = {2335--2344},
  year      = {2016},
  url       = {https://doi.org/10.1109/TVLSI.2015.2501353},
  doi       = {10.1109/TVLSI.2015.2501353},
  timestamp = {Sat, 07 Apr 2018 14:25:46 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tvlsi/ZhangMWSS16},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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