BibTeX record conf/esem/CamposM17

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@inproceedings{DBLP:conf/esem/CamposM17,
  author    = {Eduardo Cunha Campos and
               Marcelo de Almeida Maia},
  title     = {Common Bug-Fix Patterns: {A} Large-Scale Observational Study},
  booktitle = {2017 {ACM/IEEE} International Symposium on Empirical Software Engineering
               and Measurement, {ESEM} 2017, Toronto, ON, Canada, November 9-10,
               2017},
  pages     = {404--413},
  year      = {2017},
  crossref  = {DBLP:conf/esem/2017},
  url       = {https://doi.org/10.1109/ESEM.2017.55},
  doi       = {10.1109/ESEM.2017.55},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/esem/CamposM17.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/esem/2017,
  editor    = {Ayse Bener and
               Burak Turhan and
               Stefan Biffl},
  title     = {2017 {ACM/IEEE} International Symposium on Empirical Software Engineering
               and Measurement, {ESEM} 2017, Toronto, ON, Canada, November 9-10,
               2017},
  publisher = {{IEEE} Computer Society},
  year      = {2017},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8169617/proceeding},
  isbn      = {978-1-5090-4039-1},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/esem/2017.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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