"Circuit Topology-Based Test Pattern Generation for Small-Delay Defects."

Sandeep Kumar Goel, Krishnendu Chakrabarty (2014)

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metadata version: 2020-06-05

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Sandeep Kumar Goel, Krishnendu Chakrabarty:
Circuit Topology-Based Test Pattern Generation for Small-Delay Defects. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits 2014: 161-184

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