"Hybrid/Top-off Test Pattern Generation Schemes for Small-Delay Defects."

Sandeep Kumar Goel, Narendra Devta-Prasanna (2014)

> Home

Details and statistics

DOI: —

access: unavailable

type: Part in Book or Collection

metadata version: 2020-06-05

- no documents available
- export record
  dblp key:
  - books/crc/14/GoelD14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/books/crc/14/GoelD14
Sandeep Kumar Goel, Narendra Devta-Prasanna:
Hybrid/Top-off Test Pattern Generation Schemes for Small-Delay Defects. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits 2014: 147-160

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.