"AEGIS: Toward Expert-in-the-loop Industrial Anomaly Detection."

Dongmin Kim et al. (2026)

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DOI: 10.1609/AAAI.V40I48.42359

access: open

type: Conference or Workshop Paper

metadata version: 2026-03-19

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Dongmin Kim, Ye Seul Sim, Suhee Yoon, Sanghyu Yoon, Seungdong Yoa, Soonyoung Lee, Woohyung Lim:
AEGIS: Toward Expert-in-the-loop Industrial Anomaly Detection. AAAI 2026: 41619-41621

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