"Large Margin Metric Learning for Multi-Label Prediction."

Weiwei Liu, Ivor W. Tsang (2015)

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DOI: 10.1609/AAAI.V29I1.9610

access: open

type: Conference or Workshop Paper

metadata version: 2024-05-07

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Weiwei Liu, Ivor W. Tsang:
Large Margin Metric Learning for Multi-Label Prediction. AAAI 2015: 2800-2806

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