"A Defect Inspection Method for Machine Vision Using Defect Probability ..."

Chanhee Jang et al. (2018)

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DOI: 10.1007/978-3-030-20887-5_9

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-31

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  - conf/accv/JangYHSKP18
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Chanhee Jang, Sang-Yun Yun, Hyejin Hwang, Hyunmin Shin, SeongSoo Kim, YangSub Park:
A Defect Inspection Method for Machine Vision Using Defect Probability Image with Deep Convolutional Neural Network. ACCV (1) 2018: 142-154

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