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"Industrial Anomaly Detection and One-class Classification using Generative ..."

Yu-Ting K. Lai et al. (2018)

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DOI: 10.1109/AIM.2018.8452228

access: closed

type: Conference or Workshop Paper

metadata version: 2020-12-04

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  dblp key:
  - conf/aimech/LaiHTC18
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Yu-Ting K. Lai, Jwu-Sheng Hu, Ya-Hui Tsai, Wei-Yao Chiu:
Industrial Anomaly Detection and One-class Classification using Generative Adversarial Networks. AIM 2018: 1444-1449

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