"Failure Rate Identification of a Reparable System Governed by Coupled ..."

Weiwei Hu et al. (2023)

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DOI: 10.23919/ACC55779.2023.10156339

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-11

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Weiwei Hu, Alexander Tepper, Bin Xie, Qing Zhang:
Failure Rate Identification of a Reparable System Governed by Coupled ODE-PDEs and Deep Learning based Implementation. ACC 2023: 961-966

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