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"Single event upset immune latch circuit design using C-element."

Ramin Rajaei, Mahmoud Tabandeh, Bizhan Rashidian (2011)

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DOI: 10.1109/ASICON.2011.6157169

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-01

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  - conf/asicon/RajaeiTR11
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Ramin Rajaei, Mahmoud Tabandeh, Bizhan Rashidian:
Single event upset immune latch circuit design using C-element. ASICON 2011: 252-255

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