"How close to the CMOS voltage scaling limit for FinFET technology? - ..."

Runsheng Wang et al. (2017)

Details and statistics

DOI: 10.1109/ASICON.2017.8252410

access: closed

type: Conference or Workshop Paper

metadata version: 2018-01-17

a service of  Schloss Dagstuhl - Leibniz Center for Informatics