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"An improved test access mechanism structure and optimization technique in ..."

Jianhua Feng et al. (2005)

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DOI: 10.1145/1120725.1120897

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  dblp key:
  - conf/aspdac/JianhuaJWH05
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  persistent URL:
  - https://dblp.org/rec/conf/aspdac/JianhuaJWH05
Jianhua Feng, Jieyi Long, Wenhua Xu, Hongfei Ye:
An improved test access mechanism structure and optimization technique in system-on-chip. ASP-DAC 2005: 23-24

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