"Bridging fault testability of BDD circuits."

Junhao Shi, Görschwin Fey, Rolf Drechsler (2005)

Details and statistics

DOI: 10.1145/1120725.1120801

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

a service of  Schloss Dagstuhl - Leibniz Center for Informatics