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"Analyzing the Impact of Process Variations on DRAM Testing Using Border ..."

Zaid Al-Ars, Ad J. van de Goor (2003)

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DOI: 10.1109/ATS.2003.1250777

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/ats/Al-ArsG03
Zaid Al-Ars, Ad J. van de Goor:
Analyzing the Impact of Process Variations on DRAM Testing Using Border Resistance Traces. Asian Test Symposium 2003: 24-27

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