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"An Off-Chip Current Sensor for IDDQ Testing of CMOS ICs."

Md. Altaf-Ul-Amin, Zahari Mohamed Darus (1998)

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DOI: 10.1109/ATS.1998.741632

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Md. Altaf-Ul-Amin, Zahari Mohamed Darus:
An Off-Chip Current Sensor for IDDQ Testing of CMOS ICs. Asian Test Symposium 1998: 318-322

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