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"Wrapper Chain Design for Testing TSVs Minimization in Circuit-Partitioned ..."
Yuanqing Cheng et al. (2011)
- Yuanqing Cheng, Lei Zhang, Yinhe Han, Jun Liu, Xiaowei Li:
Wrapper Chain Design for Testing TSVs Minimization in Circuit-Partitioned 3D SoC. Asian Test Symposium 2011: 181-186
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