"Optimal test-set generation for parametric fault detection in switched ..."

Wooyoung Choi, Ramesh Harjani, Bapiraju Vinnakota (2000)

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DOI: 10.1109/ATS.2000.893605

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Wooyoung Choi, Ramesh Harjani, Bapiraju Vinnakota:
Optimal test-set generation for parametric fault detection in switched capacitor filters. Asian Test Symposium 2000: 72-77

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