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"Analysis of Software Test Item Generation - Comparison between High ..."
Masayuki Hirayama et al. (2003)
- Masayuki Hirayama, Tetsuya Yamamoto, Osamu Mizuno, Tohru Kikuno:
Analysis of Software Test Item Generation - Comparison between High Skilled and Low Skilled Engineers. Asian Test Symposium 2003: 210-215
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