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"A Test Generation Method for State-Observable FSMs to Increase Defect ..."

Ryoichi Inoue, Toshinori Hosokawa, Hideo Fujiwara (2008)

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DOI: 10.1109/ATS.2008.32

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/ats/InoueHF08
Ryoichi Inoue, Toshinori Hosokawa, Hideo Fujiwara:
A Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint. ATS 2008: 27-34

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