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"Deep Learning-assisted Scan Chain Diagnosis with Different Fault Models ..."

Utsav Jana et al. (2022)

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DOI: 10.1109/ATS56056.2022.00025

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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  dblp key:
  - conf/ats/JanaB0BUF22
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Utsav Jana, Sourav Banerjee, Binod Kumar, Madhu B, Shankar Umapathi, Masahiro Fujita:
Deep Learning-assisted Scan Chain Diagnosis with Different Fault Models during Manufacturing Test. ATS 2022: 72-77

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