"IEEE 1500 Compatible Interconnect Test with Maximal Test Concurrency."

Katherine Shu-Min Li et al. (2009)

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DOI: 10.1109/ATS.2009.67

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Katherine Shu-Min Li, Yi-Yu Liao, Yuo-Wen Liu, Jr-Yang Huang:
IEEE 1500 Compatible Interconnect Test with Maximal Test Concurrency. Asian Test Symposium 2009: 269-274

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