"Multi-level EDT to Reduce Scan Channels in SoC Designs."

Guoliang Li et al. (2012)

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DOI: 10.1109/ATS.2012.70

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Guoliang Li, Jun Qian, Peter Li, Greg Zuo:
Multi-level EDT to Reduce Scan Channels in SoC Designs. Asian Test Symposium 2012: 77-82

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