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"Deterministic test generation for non-classical faults on the gate level."

Udo Mahlstedt, Jürgen Alt, Ingo Hollenbeck (1995)

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DOI: 10.1109/ATS.1995.485343

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/ats/MahlstedtAH95
Udo Mahlstedt, Jürgen Alt, Ingo Hollenbeck:
Deterministic test generation for non-classical faults on the gate level. Asian Test Symposium 1995: 244-251

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