BibTeX record conf/ats/MichinishiYOIF96

download as .bib file

@inproceedings{DBLP:conf/ats/MichinishiYOIF96,
  author    = {Hiroyuki Michinishi and
               Tokumi Yokohira and
               Takuji Okamoto and
               Tomoo Inoue and
               Hideo Fujiwara},
  title     = {A Test Methodology for Interconnect Structures of LUT-based FPGAs},
  booktitle = {5th Asian Test Symposium {(ATS} '96), November 20-22, 1996, Hsinchu,
               Taiwan},
  pages     = {68--74},
  publisher = {{IEEE} Computer Society},
  year      = {1996},
  url       = {https://doi.org/10.1109/ATS.1996.555139},
  doi       = {10.1109/ATS.1996.555139},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/ats/MichinishiYOIF96.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics