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"Improvement of Detectability for CMOS Floating Gate Defects in Supply ..."
Hiroyuki Michinishi et al. (2003)
- Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo:
Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test. Asian Test Symposium 2003: 406-411
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