"DFT for fast testing of self-timed control circuits."

Sandeep Pagey, Ajay Khoche, Erik Brunvand (1995)

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DOI: 10.1109/ATS.1995.485364

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Sandeep Pagey, Ajay Khoche, Erik Brunvand:
DFT for fast testing of self-timed control circuits. Asian Test Symposium 1995: 382-386

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