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"A Postprocessing Procedure to Reduce the Number of Different Test Lengths ..."
Irith Pomeranz, Sudhakar M. Reddy (2001)
- Irith Pomeranz, Sudhakar M. Reddy:
A Postprocessing Procedure to Reduce the Number of Different Test Lengths in a Test Set for Scan Circuits. Asian Test Symposium 2001: 131-136
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