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"Alternative Run-Length Coding through Scan Chain Reconfiguration for Joint ..."

Youhua Shi et al. (2004)

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DOI: 10.1109/ATS.2004.21

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Youhua Shi, Shinji Kimura, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki:
Alternative Run-Length Coding through Scan Chain Reconfiguration for Joint Minimization of Test Data Volume and Power Consumption in Scan Test. Asian Test Symposium 2004: 432-437

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