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"High-Speed Serial Embedded Deterministic Test for System-on-Chip Designs."

Maciej Trawka et al. (2014)

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DOI: 10.1109/ATS.2014.25

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/ats/TrawkaMMPRJT14
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  persistent URL:
  - https://dblp.org/rec/conf/ats/TrawkaMMPRJT14
Maciej Trawka, Grzegorz Mrugalski, Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jakub Janicki, Jerzy Tyszer:
High-Speed Serial Embedded Deterministic Test for System-on-Chip Designs. ATS 2014: 74-80

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