"Issues Related to the Formulation of DFT Solution for Analog Circuit Test ..."

Mike W. T. Wong (2003)

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DOI: 10.1109/ATS.2003.1250795

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Mike W. T. Wong:
Issues Related to the Formulation of DFT Solution for Analog Circuit Test Using Equivalent Fault Analysis. Asian Test Symposium 2003: 120-123

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