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"Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption."

Yucong Zhang et al. (2017)

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DOI: 10.1109/ATS.2017.37

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/ats/ZhangHWMKQ17
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  persistent URL:
  - https://dblp.org/rec/conf/ats/ZhangHWMKQ17
Yucong Zhang, Stefan Holst, Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Jun Qian:
Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption. ATS 2017: 145-150

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