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"The Effects of Carbon Doping on the Performance and Electrical Reliability ..."

Harrison P. Lee et al. (2023)

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DOI: 10.1109/BCICTS54660.2023.10310859

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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  - conf/bcicts/LeeSTMNRBPRJC23
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  - https://dblp.org/rec/conf/bcicts/LeeSTMNRBPRJC23
Harrison P. Lee, Nelson Sepúlveda-Ramos, Jeffrey W. Teng, Jackson P. Moody, Delgermaa Nergui, Brett L. Ringel, Zachary R. Brumbach, Alizeh Premani, Uppili S. Raghunathan, Vibhor Jain, John D. Cressler:
The Effects of Carbon Doping on the Performance and Electrical Reliability of SiGe HBTs. BCICTS 2023: 253-256

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