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"Deep Metric Learning Meets Deep Clustering: An Novel Unsupervised Approach ..."

Binh X. Nguyen et al. (2020)

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DOI: —

access: open

type: Conference or Workshop Paper

metadata version: 2023-04-18

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  - electronic edition @ bmvc2020-conference.com (open access)
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  dblp key:
  - conf/bmvc/NguyenNCTTD20
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  persistent URL:
  - https://dblp.org/rec/conf/bmvc/NguyenNCTTD20
Binh X. Nguyen, Binh D. Nguyen, Gustavo Carneiro, Erman Tjiputra, Quang D. Tran, Thanh-Toan Do:
Deep Metric Learning Meets Deep Clustering: An Novel Unsupervised Approach for Feature Embedding. BMVC 2020

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