"Mura Defect Detection on Compact Camera Module (CCM) Using Metric Learning."

Y. G. Kim, T. H. Park (2020)

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DOI: 10.1109/CASE48305.2020.9216886

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-14

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Y. G. Kim, T. H. Park:
Mura Defect Detection on Compact Camera Module (CCM) Using Metric Learning. CASE 2020: 1263-1268

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