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"DFB Laser Chip Defect Detection Based on Successive Subspace Learning."

Dennis Hou et al. (2020)

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DOI: 10.1109/CCWC47524.2020.9031246

access: closed

type: Conference or Workshop Paper

metadata version: 2020-03-26

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  dblp key:
  - conf/ccwc/HouLZWPH20
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  - https://dblp.org/rec/conf/ccwc/HouLZWPH20
Dennis Hou, Tuo Liu, Xiaobin Zhang, Yuxi Wang, Yen-Ting Pan, Janpu Hou:
DFB Laser Chip Defect Detection Based on Successive Subspace Learning. CCWC 2020: 61-64

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