"Dynamic variation monitor for measuring the impact of voltage droops on ..."

Keith A. Bowman et al. (2010)

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DOI: 10.1109/CICC.2010.5617415

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Keith A. Bowman, Carlos Tokunaga, James W. Tschanz, Arijit Raychowdhury, Muhammad M. Khellah, Bibiche M. Geuskens, Shih-Lien Lu, Paolo A. Aseron, Tanay Karnik, Vivek De:
Dynamic variation monitor for measuring the impact of voltage droops on microprocessor clock frequency. CICC 2010: 1-4

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