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"Sampling circuits that break the kT/C thermal noise limit."

Ron Kapusta, Haiyang Zhu, Colin Lyden (2013)

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DOI: 10.1109/CICC.2013.6658440

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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  - https://dblp.org/rec/conf/cicc/KapustaZL13
Ron Kapusta, Haiyang Zhu, Colin Lyden:
Sampling circuits that break the kT/C thermal noise limit. CICC 2013: 1-6

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