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"High-Voltage-Tolerant I/O Circuit Design for USB 2.0-Compliant Applications."

Moon-Jung Kim et al. (2007)

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DOI: 10.1109/CICC.2007.4405779

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Moon-Jung Kim, Henrik Icking, Harald Gossner, Thomas H. Lee:
High-Voltage-Tolerant I/O Circuit Design for USB 2.0-Compliant Applications. CICC 2007: 491-494

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