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"Technology Scaling of ESD Devices in State of the Art FinFET Technologies."

Sukjin Kim et al. (2020)

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DOI: 10.1109/CICC48029.2020.9075899

access: closed

type: Conference or Workshop Paper

metadata version: 2020-05-04

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  - conf/cicc/KimSSLCPKKJ20
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  - https://dblp.org/rec/conf/cicc/KimSSLCPKKJ20
Sukjin Kim, Radhakrishnan Sithanandam, Woojin Seo, Mijin Lee, Sangyoung Cho, Juho Park, Hyukhoon Kwon, Namho Kim, Chanhee Jeon:
Technology Scaling of ESD Devices in State of the Art FinFET Technologies. CICC 2020: 1-6

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