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"Statistical aging under dynamic voltage scaling: A logarithmic model approach."

Jyothi Velamala et al. (2012)

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DOI: 10.1109/CICC.2012.6330572

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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  dblp key:
  - conf/cicc/VelamalaSSASC12
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  - https://dblp.org/rec/conf/cicc/VelamalaSSASC12
Jyothi Velamala, Ketul Sutaria, Hirofumi Shimizu, Hiromitsu Awano, Takashi Sato, Yu Cao:
Statistical aging under dynamic voltage scaling: A logarithmic model approach. CICC 2012: 1-4

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