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"Studies on SEE Characteristic and Hardening Techniques of CMOS SRAM with ..."

Xing-hua He et al. (2008)

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DOI: 10.1007/978-90-481-3660-5_33

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-19

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  dblp key:
  - conf/cisse/Xing-huaCYH08
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Xing-hua He, Cong Zhang, Yong-liang Zhang, Huan-zhang Lu:
Studies on SEE Characteristic and Hardening Techniques of CMOS SRAM with Sub-micro Feature Sizes. SCSS (2) 2008: 191-196

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