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"Second-Order Mutation Testing Cost Reduction Based on Mutant Clustering ..."

Jing Liu, Li Song (2021)

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DOI: 10.1109/COMPSAC51774.2021.00131

access: closed

type: Conference or Workshop Paper

metadata version: 2021-12-02

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Jing Liu, Li Song:
Second-Order Mutation Testing Cost Reduction Based on Mutant Clustering using SOM Neural Network Model. COMPSAC 2021: 974-979

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