"Defect Tracing System Based on Orthogonal Defect Classification."

Tiejun Pan, Leina Zheng, Chengbin Fang (2008)

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DOI: 10.1109/CSSE.2008.761

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Tiejun Pan, Leina Zheng, Chengbin Fang:
Defect Tracing System Based on Orthogonal Defect Classification. CSSE (2) 2008: 574-577

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