BibTeX record conf/dac/ChengTDRK96

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@inproceedings{DBLP:conf/dac/ChengTDRK96,
  author    = {Yi{-}Kan Cheng and
               Chin{-}Chi Teng and
               Abhijit Dharchoudhury and
               Elyse Rosenbaum and
               Sung{-}Mo Kang},
  title     = {iCET: {A} Complete Chip-Level Thermal Reliability Diagnosis Tool for
               {CMOS} {VLSI} Chips},
  booktitle = {Proceedings of the 33st Conference on Design Automation, Las Vegas,
               Nevada, USA, Las Vegas Convention Center, June 3-7, 1996},
  pages     = {548--551},
  year      = {1996},
  crossref  = {DBLP:conf/dac/1996},
  url       = {https://doi.org/10.1145/240518.240622},
  doi       = {10.1145/240518.240622},
  timestamp = {Tue, 06 Nov 2018 16:58:18 +0100},
  biburl    = {https://dblp.org/rec/conf/dac/ChengTDRK96.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dac/1996,
  editor    = {Thomas Pennino and
               Ellen J. Yoffa},
  title     = {Proceedings of the 33st Conference on Design Automation, Las Vegas,
               Nevada, USA, Las Vegas Convention Center, June 3-7, 1996},
  publisher = {{ACM} Press},
  year      = {1996},
  url       = {http://dl.acm.org/citation.cfm?id=240518},
  isbn      = {0-89791-779-0},
  timestamp = {Mon, 29 Nov 2021 04:57:20 +0100},
  biburl    = {https://dblp.org/rec/conf/dac/1996.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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