"Radiation-Induced Soft Error Analysis of SRAMs in SOI FinFET Technology: A ..."

Saman Kiamehr et al. (2014)

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DOI: 10.1145/2593069.2593196

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Saman Kiamehr, Thomas H. Osiecki, Mehdi Baradaran Tahoori, Sani R. Nassif:
Radiation-Induced Soft Error Analysis of SRAMs in SOI FinFET Technology: A Device to Circuit Approach. DAC 2014: 201:1-201:6

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