"Hierarchical Test Generation under Intensive Global Functional Constraints."

Jaushin Lee, Janak H. Patel (1992)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2017-03-16

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Jaushin Lee, Janak H. Patel:
Hierarchical Test Generation under Intensive Global Functional Constraints. DAC 1992: 261-266

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