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"Verification of digitally-intensive analog circuits via kernel ridge ..."

Honghuang Lin, Peng Li, Chris J. Myers (2013)

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DOI: 10.1145/2463209.2488814

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-31

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Honghuang Lin, Peng Li, Chris J. Myers:
Verification of digitally-intensive analog circuits via kernel ridge regression and hybrid reachability analysis. DAC 2013: 66:1-66:6

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